• 1.

    System for reconstructing magnetic particle image based on pre-trained model , Date of Patent: Nov. 5, 2024, Patent No.:US 12,136,146 B1, Inventor(s): Jie Tian, Zechen Wei, Hui Hui, Xin Yang

  • 2.

    System for reconstructing magnetic particle image based on adaptive optimization of regularization terms , Date of Patent: Oct. 15, 2024, Patent No.:US 12, 117, 508 B1, Inventor(s): Jie Tian, Zechen Wei, Hui Hui, Liwen Zhang, Xin Yang, Tao Zhu

  • 3.

    Signal Amplitude Feature-based Method for Fast Reconstructing a Magnetic Particle Imaging and Device, Date of Patent: Nov. 5, 2024, Patent No.:US 12,136,145 B2, Inventor(s): Jie Tian, Peng Zhang, Hui Hui, Yimeng Li, Lin Yin, Xin Feng

  • 1.

    Method and System for Reconstructing Magnetic Particle Distribution Model Based on Time-frequency Spectrum Enhancement, Date of Patent: 2023-11-14, Patent No.: US 11,816,767 B1,Inventor(s): Jie Tian; Zechen Wei; Hui Hui; Xin Yang; Huiling Peng ;

  • 2.

    Non-uniform Excitation Field-based Method and System for Performing Magnetic Nanoparticle Imaging, Date of Patent:2023-10-3, Patent No.: US 11, 771, 336 B2, Inventor(s): Jie Tian; Yanjun Liu; Hui Hui; Lin Yin; Xin Feng

  • 1.

    FFL-based Magnetic Particle Imaging Three-dimensional Reconstruction Method, System and Device, Date of Patent: 2021-03-09, Patent No.:US 10,939,845 B2, Inventor(s): Jie Tian, Peng Zhang, Hui Hui, Kun Wang, Xin Yang